Quantitative analysis of X-Ray diffraction spectra for determine structural properties and deformation energy of Al, Cu and Si

Abstract

Abstract X-Ray Diffraction (XRD) method was used to analysis structural properties of Al, Si and Cu as cubic crystal system. Existence of Al, Si and Cu was investigated with the joint committee on powder diffraction standards (JCPDS) by 96-901-3104 for Si, 96-431-3215 for Al and 96-901-1605 for Cu respectively. In this paper we determine the concentration of our sample from the 3 or 4 peak area and the intensity of each peak. The content of Al, Si and Cu are 78,97%, 80,69% and 82,51% respectively. Relative texture coefficient (RTC) value investigated from diffraction by using h k l plane. Energy density, stress and strain were calculated using uniform density model (UDM), uniform stress deformation model (USDM), uniform deformation energy density model (UDEDM) and size-strain plot method. For the crystallite size we applied the Scherrer equation, Williamson-Hall (W-H) analysis and Size-Strain plot (SSP) method. High correlations the crystallite size found from the results by Scherrer, W-H, and SSP.

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