# Electronic and optical properties of aluminum oxide before and after surface reduction by Ar+ bombardment
> Tahir D.

URL kanonis: https://discover.unhas.ac.id/publications/pub_scopus_85056169763
Jurnal / Konferensi: Atom Indonesia
Tahun terbit: 2014
DOI: https://doi.org/10.17146/aij.2014.273
ISSN: 23565322
Kuartil SJR: Q3
Citations: 5

## Authors
- Tahir D.

## Abstract
The electronic and optical properties of a -Al 2 O 3 after induced by 3-keV Ar + sputtering have been studied quantitatively by use of reflection electron energy loss spectroscopy (REELS) spectra. The band gap values of a -Al 2 O 3 was determined from the onset values of the energy loss spectrum to the background level of REELS spectra as a function of time Ar + bombardment. The bandgap changes from 8.4 eV before sputtering to 6.2 eV after 4 minutes of sputtering. The optical properties of α -Al 2 O 3 thin films have been determined by comparing the experimental cross section obtained from reflection electron energy loss spectroscopy with the theoretical inelastic scattering cross section, deduced from the simulated energy loss function (ELF) by using QUEELS-ε(k)-REELS software. The peak assignments are based on ELF and compared with reported data on the electronic structure of α -Al 2 O 3 obtained using different techniques. The results demonstrate that the electronic and optical properties before and after surface reduction will provide further understanding in the fundamental properties of α -Al 2 O 3 which will be useful in the design, modeling and analysis of devices applications performance. Normal 0 false false false IN X-NONE X-NONE /* Style Definitions */ table.MsoNormalTable {mso-style-name:"Table Normal"; mso-tstyle-rowband-size:0; mso-tstyle-colband-size:0; mso-style-noshow:yes; mso-style-priority:99; mso-style-parent:""; mso-padding-alt:0cm 5.4pt 0cm 5.4pt; mso-para-margin-top:0cm; mso-para-margin-right:0cm; mso-para-margin-bottom:10.0pt; mso-para-margin-left:0cm; line-height:115%; mso-pagination:widow-orphan; font-size:11.0pt; font-family:"Calibri","sans-serif"; mso-ascii-font-family:Calibri; mso-ascii-theme-font:minor-latin; mso-hansi-font-family:Calibri; mso-hansi-theme-font:minor-latin; mso-fareast-language:EN-US;} Received: 18 November 2013; Revised:12 June 2014; Accepted: 25 June 2014

## Keywords
- Sputtering
- Electron energy loss spectroscopy
- Atomic physics
- Materials science
- Reflection (computer programming)
- Spectral line
- Band gap
- Spectroscopy
- Analytical Chemistry (journal)
- Irradiation
- Thin film
- Chemistry
- Optoelectronics
- Physics
- Nanotechnology
- Computer science
- Nuclear physics
- Transmission electron microscopy
- Programming language
- Chromatography
- Astronomy
- Quantum mechanics

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Sumber: Discover Unhas — RIMS Universitas Hasanuddin.
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