# Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS
> Denny Y.R.

URL kanonis: https://discover.unhas.ac.id/publications/pub_scopus_84862809571
Jurnal / Konferensi: Journal of Electron Spectroscopy and Related Phenomena
Tahun terbit: 2012
DOI: https://doi.org/10.1016/j.elspec.2011.12.004
ISSN: 03682048
Kuartil SJR: Q2
Citations: 57

## Authors
- Denny Y.R.

## Abstract
Sourced directly from Elsevier Scopus. No OpenAlex abstract available.

## Keywords
- X-ray photoelectron spectroscopy
- Materials science
- Thin film
- Band gap
- Indium
- Refractive index
- Analytical Chemistry (journal)
- Molar absorptivity
- Optoelectronics
- Optics
- Chemistry
- Nuclear magnetic resonance
- Nanotechnology
- Physics
- Chromatography

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Sumber: Discover Unhas — RIMS Universitas Hasanuddin.
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