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Characterization of nanocrystalline ZnO:Al films by sol-gel spin coating method
Gareso P.L.
Aip Conference Proceedings
Abstract
Nanocrystalline ZnO films doped with aluminium by sol-gel spin coating method have been investigated using optical transmitance UV-Vis and X-ray diffraction (X-RD) measurements. ZnO films were prepared using zinc acetate dehydrate (Zn(CH3COO)2.2H2O), ethanol, and diethanolamine (DEA) as a starting material, solvent, and stabilizer, respectively. For doped films, AlCl3 was added to the mixture. The ZnO:Al films were deposited on a transparent conductive oxide (TCO) substrate using spin coating tecnique at room temperature with a rate of 3000 rpm in 30 sec. The deposited films were annealed at various temperatures from 400oC to 600oC during 60 minutes. The transmitance UV-Vis measurement results showed that after annealing at 400oC, the energy band gap profile of nanocrystalline ZnO:Al film was a blue shift. This indicated that the band gap of ZnO:Al increassed after annealing due to the increase of crystalinity size. As the annealing temperature increased the bandgap energy was a constant. In addition to this, there was a small oscillation occuring after annealing compared to the as???grown samples. In the case of X-RD measurements, the crystalinity of the films were amorphous before annealing, and after annealing the crystalinity became enhance. Also, X-RD results showed that structure of nanocrystalline ZnO:Al films were hexagonal polycrystalline with lattice parameters are a = 3.290 ?? and c = 5.2531 ??.